Workshop on Scanning Electron Microscopy (SEM): Principles, Sample Preparation, Imaging and Data Interpretation
This workshop provides a comprehensive introduction to Scanning Electron Microscopy (SEM), covering its working principles, sample preparation techniques, imaging methods, and data interpretation. Participants will gain practical knowledge to effectively analyze microstructural features and generate high-quality SEM results for research and industrial applications.
📅 Event Details
| 📆 Date: | June 21, 2026 |
| ⏰ Time: | 6:00 pm - 7:30 pm |
| 💻 Mode: | Online |
| ⏱️ Duration: | 2 hours |
| 💰 Fee: | ₹150 |
| 👥 Level: | Target Audience / Level Target Audience: Faculty Members Ph.D. Scholars Postgraduate (PG) Students Researchers Industry Professionals Laboratory Scientists and Engineers Level: Beginner to Intermediate |
🎯 About the Event
Scanning Electron Microscopy (SEM) is one of the most powerful characterization techniques used in materials science, nanotechnology, metallurgy, polymers, electronics, life sciences, and industrial quality control. This workshop is designed to provide participants with a clear understanding of SEM fundamentals, including electron–matter interactions, instrument components, sample preparation requirements, image acquisition, and interpretation of microstructural data.
The session will bridge theoretical concepts with practical insights, enabling attendees to understand how SEM images are generated, how to optimize imaging parameters, and how to extract meaningful information from microscopic observations. The workshop is ideal for students, researchers, and professionals seeking to strengthen their microscopy and characterization skills.
📚 Key Topics to be Covered
Introduction to Electron Microscopy
Fundamentals of Scanning Electron Microscopy (SEM)
Electron–Matter Interactions
Components and Working Principle of SEM
Vacuum Systems and Electron Sources
Sample Preparation Techniques for Various Materials
Conductive and Non-Conductive Samples
Imaging Modes: Secondary Electrons and Backscattered Electrons
Magnification, Resolution, and Depth of Field
Image Acquisition and Optimization
SEM Image Analysis and Data Interpretation
Common Artifacts and Troubleshooting
Applications of SEM in Materials Science, Nanotechnology, Biology, and Industry
Best Practices for High-Quality Imaging
🏆 Certification
Certification
E-Certificate of Participation will be provided to all registered participants who attend the workshop. Participants will also receive lecture notes and learning resources for future reference.
📞 Contact Information
Organized by
Dr. Deepshikha Rathore
Director
Center for Research and Innovation, MatSense OPC Pvt. Ltd., Bangalore, India
Contact Detail:
Mob: 8871937263
Email: director@matsense.in
Website: www.matsense.in